Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Comparative study of the interface passivation properties of LiF and Al2O3 using silicon MIS capacitor
Publication:
Comparative study of the interface passivation properties of LiF and Al2O3 using silicon MIS capacitor
Copy permalink
Date
2024-APR 1
Journal article
https://doi.org/10.1063/5.0203484
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Parion, Jonathan
;
Scaffidi, Romain
;
Duerinckx, Filip
;
Sivaramakrishnan Radhakrishnan, Hariharsudan
;
Flandre, Denis
;
Poortmans, Jef
;
Vermang, Bart
Journal
APPLIED PHYSICS LETTERS
Abstract
Description
Metrics
Views
546
since deposited on 2024-04-20
1
last month
Acq. date: 2026-01-07
Citations
Metrics
Views
546
since deposited on 2024-04-20
1
last month
Acq. date: 2026-01-07
Citations