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Thermo-mechanical characterization of copper through-silicon-via intercnnect for 3D chip stacking
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Thermo-mechanical characterization of copper through-silicon-via intercnnect for 3D chip stacking
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Date
2010-12
Dissertation
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22414.pdf
13.73 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Okoro, Chukwudi
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Abstract
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since deposited on 2021-10-18
Acq. date: 2025-12-11
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since deposited on 2021-10-18
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Acq. date: 2025-12-11
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Downloads
2
since deposited on 2021-10-18
Acq. date: 2025-12-11
Views
2131
since deposited on 2021-10-18
5
last month
Acq. date: 2025-12-11
Citations