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The potential of double patterning immersion lithography for the 32nm half pitch node
Publication:
The potential of double patterning immersion lithography for the 32nm half pitch node
Date
2007-08
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wiaux, Vincent
;
Storms, Greet
;
Cheng, Shaunee
;
Maenhoudt, Mireille
Journal
EuroAsia Semiconductor
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1854
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1854
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations