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Strain and composition monitoring in various (Si)Ge fin structures using in-line HRXRD
Publication:
Strain and composition monitoring in various (Si)Ge fin structures using in-line HRXRD
Date
2017
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schulze, Andreas
;
Loo, Roger
;
Witters, Liesbeth
;
Mertens, Hans
;
Collaert, Nadine
;
Horiguchi, Naoto
;
Wormington, Matthew
;
Ryan, Paul
;
Vandervorst, Wilfried
;
Caymax, Matty
Journal
Abstract
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1896
since deposited on 2021-10-24
438
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Acq. date: 2025-10-25
Citations
Metrics
Views
1896
since deposited on 2021-10-24
438
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations