Publication:

Strain and composition monitoring in various (Si)Ge fin structures using in-line HRXRD

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1905 since deposited on 2021-10-24
2last month
Acq. date: 2026-08-08

Citations

Statistics

Views

1905 since deposited on 2021-10-24
2last month
Acq. date: 2026-08-08

Citations