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A simulation study on process sensitivity of a line tunnel field-effect transistor
Publication:
A simulation study on process sensitivity of a line tunnel field-effect transistor
Date
2013
Journal article
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26564.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Walke, Amey
;
Vandenberghe, William
;
Kao, Frank
;
Vandooren, Anne
;
Groeseneken, Guido
Journal
IEEE Transactions on Electron Devices
Abstract
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1964
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
Metrics
Views
1964
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations