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TEM analysis and electrical probing on thin TEM lamellas of CBRAM stacks
Publication:
TEM analysis and electrical probing on thin TEM lamellas of CBRAM stacks
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Date
2014
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31698.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Seidel, Felix
;
Richard, Olivier
;
Bender, Hugo
;
Hantschel, Thomas
;
Goux, Ludovic
;
Jurczak, Gosia
;
Vandervorst, Wilfried
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1993
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Acq. date: 2025-12-15
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Metrics
Views
1993
since deposited on 2021-10-22
6
last month
1
last week
Acq. date: 2025-12-15
Citations