Publication:

TEM analysis and electrical probing on thin TEM lamellas of CBRAM stacks

Date

2014
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dc.contributor.authorSeidel, Felix
dc.contributor.authorRichard, Olivier
dc.contributor.authorBender, Hugo
dc.contributor.authorHantschel, Thomas
dc.contributor.authorGoux, Ludovic
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorSeidel, Felix
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.accessioned2021-10-22T05:39:14Z
dc.date.available2021-10-22T05:39:14Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24503
dc.source.conference18th International Microscopy Conference - IMC
dc.source.conferencedate7/09/2014
dc.source.conferencelocationPrague Czech Republic
dc.title

TEM analysis and electrical probing on thin TEM lamellas of CBRAM stacks

dc.typeOral presentation
dspace.entity.typePublication
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