Publication:
Improved PBTI reliability in junction-less nFETs fabricated at low thermal budget for 3D sequential integration
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1921 since deposited on 2021-10-26
2last month
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Acq. date: 2025-12-10
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Views
1921 since deposited on 2021-10-26
2last month
1last week
Acq. date: 2025-12-10
Citations