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Characterisation of the local mechanical stress in sub-0.25 μm microelectronic technologies

Date

 
dc.contributor.authorStuer, Cindy
dc.date.accessioned2021-10-14T17:55:56Z
dc.date.available2021-10-14T17:55:56Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5690
dc.title

Characterisation of the local mechanical stress in sub-0.25 μm microelectronic technologies

dc.typePHD thesis
dspace.entity.typePublication
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