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Experimental verification of a random medium model for the optical behaviour of ultrathin crystalline silicon layers grown on porous silicon
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Experimental verification of a random medium model for the optical behaviour of ultrathin crystalline silicon layers grown on porous silicon
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Date
1999
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Stalmans, Lieven
;
Abouelsaoud, A. A.
;
Ghannam, Moustafa
;
Poortmans, Jef
;
Bender, Hugo
;
Caymax, Matty
;
Nijs, Johan
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1951
since deposited on 2021-10-14
Acq. date: 2025-12-11
Citations
Metrics
Views
1951
since deposited on 2021-10-14
Acq. date: 2025-12-11
Citations