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Experimental verification of a random medium model for the optical behaviour of ultrathin crystalline silicon layers grown on porous silicon

Date

1999
Proceedings Paper
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dc.contributor.authorStalmans, Lieven
dc.contributor.authorAbouelsaoud, A. A.
dc.contributor.authorGhannam, Moustafa
dc.contributor.authorPoortmans, Jef
dc.contributor.authorBender, Hugo
dc.contributor.authorCaymax, Matty
dc.contributor.authorNijs, Johan
dc.contributor.imecauthorGhannam, Moustafa
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-10-14T11:40:42Z
dc.date.available2021-10-14T11:40:42Z
dc.date.embargo9999-12-31
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3849
dc.source.beginpage207
dc.source.conferenceAmorphous and Heterogeneous Silicon Thin Films: Fundamentals to Devices - 1999
dc.source.conferencedate5/04/1999
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage212
dc.title

Experimental verification of a random medium model for the optical behaviour of ultrathin crystalline silicon layers grown on porous silicon

dc.typeProceedings paper
dspace.entity.typePublication
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