Publication:
A low-frequency noise study of the physical hot-carrier degradation mechanisms in lowly-doped-drain Si MOSFETs
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2005 since deposited on 2021-09-29
2last month
Acq. date: 2026-04-06
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Statistics
Views
2005 since deposited on 2021-09-29
2last month
Acq. date: 2026-04-06
Citations