Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
The electrical equivalent sidewall damage in patterned low-k dielectrics
Publication:
The electrical equivalent sidewall damage in patterned low-k dielectrics
Copy permalink
Date
2004-02
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Iacopi, Francesca
;
Stucchi, Michele
;
Richard, Olivier
;
Maex, Karen
Journal
Electrochemical and Solid State Letters
Abstract
Description
Metrics
Views
1936
since deposited on 2021-10-15
Acq. date: 2025-12-17
Citations
Metrics
Views
1936
since deposited on 2021-10-15
Acq. date: 2025-12-17
Citations