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The electrical equivalent sidewall damage in patterned low-k dielectrics
Publication:
The electrical equivalent sidewall damage in patterned low-k dielectrics
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Iacopi, Francesca
;
Stucchi, Michele
;
Richard, Olivier
;
Maex, Karen
Journal
Electrochemical and Solid State Letters
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1938
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Acq. date: 2026-08-08
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Statistics
Views
1938
since deposited on 2021-10-15
2
last month
1
last week
Acq. date: 2026-08-08
Citations