Publication:

Electrical properties and noise of poly SiGe deposited at temperatures compatible with MEMS integration on top of standard CMOS

Date

Loading...
Thumbnail Image

Author(s)

Journal

Abstract

Description

Metrics

Views

1876 since deposited on 2021-10-14
Acq. date: 2025-12-13

Citations

Metrics

Views

1876 since deposited on 2021-10-14
Acq. date: 2025-12-13

Citations