Publication:
Improved NBTI reliability with sub 1-nanometer EOT ZrO2 compared to HfO2 gate dielectric
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1780 since deposited on 2021-10-21
Acq. date: 2025-12-15
Citations
Metrics
Views
1780 since deposited on 2021-10-21
Acq. date: 2025-12-15
Citations