Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
Improved NBTI reliability with sub 1-nanometer EOT ZrO2 compared to HfO2 gate dielectric
Statistics
Statistics by Category
Download view's map
PNG
JPEG/JPG
Reports
Most viewed
Most viewed per month
Top city views
File Visits
Export Excel
Export CSV
Item
Views
Improved NBTI reliability with sub 1-nanometer EOT ZrO2 compared to HfO2 gate dielectric
1334