Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Demonstration of ultra-thin Si grinding process controlled by in-situ non-contact gauge for 3D stacked IC (3D-SIC)
Publication:
Demonstration of ultra-thin Si grinding process controlled by in-situ non-contact gauge for 3D stacked IC (3D-SIC)
Copy permalink
Date
2010
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhao, Ming
;
Verbinnen, Greet
;
Yoshida, Shinji
;
Hayakawa, Susumu
;
Tabuchi, Tomotaka
;
Jourdain, Anne
;
Beyne, Eric
;
Swinnen, Bart
;
Leunissen, Peter
Journal
Abstract
Description
Metrics
Views
2272
since deposited on 2021-10-19
4
last month
1
last week
Acq. date: 2025-12-11
Citations
Metrics
Views
2272
since deposited on 2021-10-19
4
last month
1
last week
Acq. date: 2025-12-11
Citations