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Quantified Uniformity and Selectivity of TiO2 Films in 45-nm Half Pitch Patterns Using Area-Selective Deposition Supercycles
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Quantified Uniformity and Selectivity of TiO2 Films in 45-nm Half Pitch Patterns Using Area-Selective Deposition Supercycles
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Date
2023
Journal article
https://doi.org/10.1002/admi.202300163
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nye, Rachel
;
Van Dongen, Kaat
;
de Marneffe, Jean-Francois
;
Parsons, Gregory N. N.
;
Delabie, Annelies
Journal
ADVANCED MATERIALS INTERFACES
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Downloads
671
since deposited on 2023-06-25
62
last month
9
last week
Acq. date: 2026-08-09
Views
981
since deposited on 2023-06-25
2
last month
Acq. date: 2026-08-10
Citations