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5nm: has the time for a device change come?

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dc.contributor.authorRaghavan, Praveen
dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorJang, Doyoung
dc.contributor.authorYakimets, Dmitry
dc.contributor.authorBaert, Rogier
dc.contributor.authorDebacker, Peter
dc.contributor.authorVerkest, Diederik
dc.contributor.authorThean, Aaron
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorJang, Doyoung
dc.contributor.imecauthorYakimets, Dmitry
dc.contributor.imecauthorBaert, Rogier
dc.contributor.imecauthorDebacker, Peter
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecDebacker, Peter::0000-0003-3825-5554
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.accessioned2021-10-23T13:57:57Z
dc.date.available2021-10-23T13:57:57Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27180
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7479213
dc.source.beginpage275
dc.source.conference17th International Symposium on Quality Electronic Design - ISQED
dc.source.conferencedate15/03/2016
dc.source.conferencelocationSanta Clara, CA USA
dc.source.endpage277
dc.title

5nm: has the time for a device change come?

dc.typeProceedings paper
dspace.entity.typePublication
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