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Atomic scale characterization of 3D structures (FinFETs) with atom probe tomography
Publication:
Atomic scale characterization of 3D structures (FinFETs) with atom probe tomography
Date
2014-03
Dissertation
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35755.pdf
33.69 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kambham, Ajay Kumar
Journal
Abstract
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1915
since deposited on 2021-10-22
Acq. date: 2025-10-25
Citations
Metrics
Views
1915
since deposited on 2021-10-22
Acq. date: 2025-10-25
Citations