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Integrated approach to improving local CD uniformity in EUV patterning
Publication:
Integrated approach to improving local CD uniformity in EUV patterning
Date
2017
Proceedings Paper
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35714.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Liang, Andrew
;
Hermans, Jan
;
Tran, Tim
;
Viatkina, Katja
;
Liang, Chen-Wei
;
Ward, Brandon
;
Chuang, Steven
;
Yu, Jengyi
;
Harm, Greg
;
Vandereyken, Jelle
;
Rio, David
;
Kubis, Michael
;
Tan, Samantha
;
Wise, Rich
;
Dusa, Mircea
;
Reddy, Sirish
;
Singhal, Akhil
;
Van Schravendijk, Bart
;
Dixit, Girish
;
Shamma, Nader
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1977
since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations
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Views
1977
since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations