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On the data interpretation of the C-AFM measurements in the characterization of thin insulating layers
Publication:
On the data interpretation of the C-AFM measurements in the characterization of thin insulating layers
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Petry, Jasmine
;
Vandervorst, Wilfried
;
Pantisano, Luigi
;
Degraeve, Robin
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1845
since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations
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Views
1845
since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations