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Publication:

Study of interface trap density in a GeSn MOS structure by numerical simulation of the electrical characteristics

Date

2013

Proceedings Paper

Simple item page Full metadata Statistics

Files

26717.pdf 251.64 KB

Author(s)

;

;

Schmeits, Marcel

;

;

Nguyen, Ngoc Duy

Statistics

1923 since deposited on 2021-10-21

Acq. date: 2026-07-28