Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Gate-last vs. gate-first technology for aggressively scaled EOT Logic/RF CMOS
Publication:
Gate-last vs. gate-first technology for aggressively scaled EOT Logic/RF CMOS
Date
2011
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
22515.pdf
1.12 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Veloso, Anabela
;
Ragnarsson, Lars-Ake
;
Cho, Moon Ju
;
Devriendt, Katia
;
Kellens, Kristof
;
Sebaai, Farid
;
Suhard, Samuel
;
Brus, Stephan
;
Crabbe, Yvo
;
Schram, Tom
;
Rohr, Erika
;
Paraschiv, Vasile
;
Eneman, Geert
;
Kauerauf, Thomas
;
Dehan, Morin
;
Hong, Sug-Hun
;
Yamaguchi, Shinpei
;
Takeoka, Shinji
;
Higuchi, Yuichi
;
Tielens, Hilde
;
Van Ammel, Annemie
;
Favia, Paola
;
Bender, Hugo
;
Franquet, Alexis
;
Conard, Thierry
;
Li, X.
;
Pey, K.-L.
;
Struyf, Herbert
;
Mertens, Paul
;
Absil, Philippe
;
Horiguchi, Naoto
;
Hoffmann, Thomas Y.
Journal
Abstract
Description
Metrics
Downloads
1
since deposited on 2021-10-19
Acq. date: 2025-10-23
Views
2165
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Downloads
1
since deposited on 2021-10-19
Acq. date: 2025-10-23
Views
2165
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations