Evidence of time-dependent vertical breakdown in GaN-on-Si HEMTs

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Author(s)

;

Meneghini, Matteo

;

Rossetto, Isabella

;

Stoffels, Steve

;

Posthuma, Niels

;

Van Hove, Marleen

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;

Decoutere, Stefaan

;

Meneghesso, Gaudenzio

;

Journal

IEEE Transactions on Electron Devices

Metrics

1982 since deposited on 2021-10-24

Acq. date: 2025-10-24