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Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors

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Acq. date: 2026-08-06

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964 since deposited on 2022-08-18
67last month
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Acq. date: 2026-08-06

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1634 since deposited on 2022-08-18
1last month
Acq. date: 2026-08-06

Citations