Publication:

Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors

Date

2020-04-03
Proceedings Paper
https://doi.org/10.1016/j.microrel.2020.113632
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Accepted version 996.55 KB

Author(s)

Simicic, Marko  
;
Ashif, Nowab Reza
;
Hellings, Geert  
;
Chen, Shih-Hung  
;
Nag, Manoj  
;
Kronemeijer, Auke Jisk
;
Myny, Kris  
;
Linten, Dimitri  

Journal

MICROELECTRONICS RELIABILITY

Abstract

Description

Metrics

Downloads

517 since deposited on 2022-08-18
30last month
4last week
Acq. date: 2026-01-10

Views

1622 since deposited on 2022-08-18
Acq. date: 2026-01-10

Citations

Metrics

Downloads

517 since deposited on 2022-08-18
30last month
4last week
Acq. date: 2026-01-10

Views

1622 since deposited on 2022-08-18
Acq. date: 2026-01-10

Citations