Publication:

Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors

Date

2020-04-03
Proceedings Paper
https://doi.org/10.1016/j.microrel.2020.113632
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Accepted version 996.55 KB

Author(s)

Simicic, Marko  
;
Ashif, Nowab Reza
;
Hellings, Geert  
;
Chen, Shih-Hung  
;
Nag, Manoj  
;
Kronemeijer, Auke Jisk
;
Myny, Kris  
;
Linten, Dimitri  

Journal

MICROELECTRONICS RELIABILITY

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