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Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors
Publication:
Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors
Date
2020-04-03
Proceedings Paper
https://doi.org/10.1016/j.microrel.2020.113632
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simicic, Marko
;
Ashif, Nowab Reza
;
Hellings, Geert
;
Chen, Shih-Hung
;
Nag, Manoj
;
Kronemeijer, Auke Jisk
;
Myny, Kris
;
Linten, Dimitri
Journal
MICROELECTRONICS RELIABILITY
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Downloads
354
since deposited on 2022-08-18
222
item.page.metrics.field.last-week
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Views
1614
since deposited on 2022-08-18
394
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations