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Articles
Film Characterization of Low-Temperature Silicon Carbon Nitride for Direct Bonding Applications
Publication:
Film Characterization of Low-Temperature Silicon Carbon Nitride for Direct Bonding Applications
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Date
2020
Journal article
https://doi.org/10.1149/2162-8777/abd260
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1.11 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nagano, Fuya
;
Iacovo, Serena
;
Phommahaxay, Alain
;
Inoue, Fumihiro
;
Sleeckx, Erik
;
Beyer, Gerald
;
Beyne, Eric
;
De Gendt, Stefan
Journal
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY
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Downloads
149
since deposited on 2021-11-02
10
last month
3
last week
Acq. date: 2026-01-10
Views
1922
since deposited on 2021-11-02
6
last month
2
last week
Acq. date: 2026-01-10
Citations