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The effect of temperature on the forward bias electrical characteristics of both pure Ni and oxidized Ni/Au Schottky contacts on n-type GaN: A case study
Publication:
The effect of temperature on the forward bias electrical characteristics of both pure Ni and oxidized Ni/Au Schottky contacts on n-type GaN: A case study
Date
2020
Journal article
https://doi.org/10.1016/j.rinp.2020.103656
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hajjiah, Ali
;
Alkhabbaz, Asmaa
;
Badran, Hussein
;
Gordon, Ivan
Journal
RESULTS IN PHYSICS
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1895
since deposited on 2021-11-02
401
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Acq. date: 2025-10-24
Citations
Metrics
Views
1895
since deposited on 2021-11-02
401
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations