Publication:

The effect of temperature on the forward bias electrical characteristics of both pure Ni and oxidized Ni/Au Schottky contacts on n-type GaN: A case study

Date

2020
Journal article
https://doi.org/10.1016/j.rinp.2020.103656
Simple item page Full metadata Statistics
 
dc.contributor.authorHajjiah, Ali
dc.contributor.authorAlkhabbaz, Asmaa
dc.contributor.authorBadran, Hussein
dc.contributor.authorGordon, Ivan
dc.contributor.imecauthorGordon, Ivan
dc.contributor.orcidimecGordon, Ivan::0000-0002-0713-8403
dc.date.accessioned2022-01-24T11:33:10Z
dc.date.available2021-11-02T16:06:48Z
dc.date.available2022-01-24T11:33:10Z
dc.date.issued2020
dc.identifier.doi10.1016/j.rinp.2020.103656
dc.identifier.issn2211-3797
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38305
dc.publisherELSEVIER
dc.source.issuena
dc.source.journalRESULTS IN PHYSICS
dc.source.numberofpages9
dc.source.volume19
dc.subject.keywordsCURRENT-VOLTAGE CHARACTERISTICS
dc.subject.keywordsMOLECULAR-BEAM EPITAXY
dc.subject.keywordsBARRIER DIODES
dc.subject.keywordsCURRENT-TRANSPORT
dc.subject.keywordsCONDUCTION MECHANISMS
dc.subject.keywordsOHMIC CONTACTS
dc.subject.keywordsAU/N-GAAS
dc.subject.keywordsDEPENDENCE
dc.subject.keywordsHEIGHTS
dc.subject.keywordsRANGE
dc.title

The effect of temperature on the forward bias electrical characteristics of both pure Ni and oxidized Ni/Au Schottky contacts on n-type GaN: A case study

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles