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A study of high NA EUV pattern stitching using rigorous stochastic lithography simulation
Publication:
A study of high NA EUV pattern stitching using rigorous stochastic lithography simulation
Date
2023
Proceedings Paper
https://doi.org/10.1117/12.2688230
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Robertson, Stewart
;
Schramm, Robert
;
Pret, Alessandro Vaglio
;
Wiaux, Vincent
Journal
Proceedings of SPIE
Abstract
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Views
907
since deposited on 2024-01-13
Acq. date: 2025-10-27
Citations
Metrics
Views
907
since deposited on 2024-01-13
Acq. date: 2025-10-27
Citations