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Multi-visit TAMs to reduce the post-bond test length of 2.5D-SICs with a passive silicon interposer base

Date

2011-11
Proceedings Paper
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dc.contributor.authorChi, Chun-Chuan
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorGoel, Sandeep K.
dc.contributor.authorWu, Cheng-Wen
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.accessioned2021-10-19T12:47:21Z
dc.date.available2021-10-19T12:47:21Z
dc.date.issued2011-11
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18678
dc.source.conferenceIEEE Asian Test Symposium - ATS
dc.source.conferencedate21/11/2011
dc.source.conferencelocationNew Delhi India
dc.title

Multi-visit TAMs to reduce the post-bond test length of 2.5D-SICs with a passive silicon interposer base

dc.typeProceedings paper
dspace.entity.typePublication
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