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Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM
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1850 since deposited on 2022-03-03
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Acq. date: 2025-10-24
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1850 since deposited on 2022-03-03
431item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations