Publication:
Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM
Loading...
Journal
Abstract
Description
Metrics
Views
1855 since deposited on 2022-03-03
1last month
1last week
Acq. date: 2026-01-05
Citations
Metrics
Views
1855 since deposited on 2022-03-03
1last month
1last week
Acq. date: 2026-01-05
Citations