Publication:
Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM
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1859 since deposited on 2022-03-03
1last month
Acq. date: 2026-03-17
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Statistics
Views
1859 since deposited on 2022-03-03
1last month
Acq. date: 2026-03-17
Citations