Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Effects of bias, pressure and temperature in plasma damage of ultra low-k films
Publication:
Effects of bias, pressure and temperature in plasma damage of ultra low-k films
Date
2008
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Urbanowicz, Adam
;
Humbert, Aurelie
;
Mannaert, Geert
;
Tokei, Zsolt
;
Baklanov, Mikhaïl
Journal
Abstract
Description
Metrics
Views
1909
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1909
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations