Publication:
Combining TEM and 3D scanning spreading resistance microscopy, a hybrid approach, to the analysis of Ge gate-all-around nano-wires
Date
Loading...
Journal
Abstract
Description
Metrics
Views
2014 since deposited on 2021-10-25
Acq. date: 2025-12-15
Citations
Metrics
Views
2014 since deposited on 2021-10-25
Acq. date: 2025-12-15
Citations