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Combining TEM and 3D scanning spreading resistance microscopy, a hybrid approach, to the analysis of Ge gate-all-around nano-wires
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2014 since deposited on 2021-10-25
Acq. date: 2026-02-28
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Statistics
Views
2014 since deposited on 2021-10-25
Acq. date: 2026-02-28
Citations