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Conference contributions
Impact of gate stack processing on the hysteresis of 300 mm integrated WS2 FETs
Publication:
Impact of gate stack processing on the hysteresis of 300 mm integrated WS2 FETs
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Date
2023
Proceedings Paper
https://doi.org/10.1109/IRPS48203.2023.10117803
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Panarella, Luca
;
Kaczer, Ben
;
Smets, Quentin
;
Verreck, Devin
;
Schram, Tom
;
Cott, Daire
;
Lin, Dennis
;
Tyaginov, Stanislav
;
Asselberghs, Inge
;
Lockhart de la Rosa, Cesar Javier
;
Kar, Gouri Sankar
;
Afanasiev, Valeri
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na
Abstract
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1038
since deposited on 2023-07-15
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Acq. date: 2025-12-15
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Metrics
Views
1038
since deposited on 2023-07-15
1
last month
1
last week
Acq. date: 2025-12-15
Citations