Publication:

In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates

Date

 
dc.contributor.authorGhica, C.
dc.contributor.authorNistor, Leona
dc.contributor.authorBender, Hugo
dc.contributor.authorSteegen, An
dc.contributor.authorLauwers, A.
dc.contributor.authorMaex, Karen
dc.contributor.authorVan Landuyt, J.
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorMaex, Karen
dc.date.accessioned2021-10-14T16:58:32Z
dc.date.available2021-10-14T16:58:32Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5315
dc.source.beginpage701
dc.source.endpage708
dc.source.issue3
dc.source.journalJournal of Materials Research
dc.source.volume16
dc.title

In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections: