Publication:

Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p(+)n(-)n Diodes: The Road to Reliable Vertical MOSFETs

Date

2021
Journal article
https://doi.org/10.3390/mi12040445
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Published version 4.5 MB

Author(s)

Mukherjee, Kalparupa
;
De Santi, Carlo
;
Buffolo, Matteo
;
Borga, Matteo  
;
You, Shuzhen  
;
Geens, Karen  
;
Meneghini, Matteo
;
Bakeroot, Benoit  
;
Decoutere, Stefaan  
;
Gerosa, Andrea
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico

Journal

MICROMACHINES

Abstract

Description

Statistics

Downloads

598 since deposited on 2022-02-18
40last month
7last week
Acq. date: 2026-04-07

Views

1886 since deposited on 2022-02-18
Acq. date: 2026-04-07

Citations

Statistics

Downloads

598 since deposited on 2022-02-18
40last month
7last week
Acq. date: 2026-04-07

Views

1886 since deposited on 2022-02-18
Acq. date: 2026-04-07

Citations