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Critical discussion of the front-back gate coupling effect on the low-frequency noise in fully depleted SOI MOSFETs
Publication:
Critical discussion of the front-back gate coupling effect on the low-frequency noise in fully depleted SOI MOSFETs
Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Mercha, Abdelkarim
;
Claeys, Cor
;
Lukyanchikova, N.
;
Garbar, N.
Journal
IEEE Trans. Electron Devices
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1953
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1953
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations