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Electro-optical characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures
Publication:
Electro-optical characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures
Date
1996
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zeng, A.
;
Jackson, M. K.
;
Van Hove, Marleen
;
De Raedt, Walter
Journal
Optical and Quantum Electronics
Abstract
Description
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1877
since deposited on 2021-09-29
411
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Acq. date: 2025-10-24
Citations
Metrics
Views
1877
since deposited on 2021-09-29
411
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations