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Electro-optical characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures
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Electro-optical characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures
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Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zeng, A.
;
Jackson, M. K.
;
Van Hove, Marleen
;
De Raedt, Walter
Journal
Optical and Quantum Electronics
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1881
since deposited on 2021-09-29
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Acq. date: 2025-12-13
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Metrics
Views
1881
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-13
Citations