Publication:
Electro-optical characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures
Date
| dc.contributor.author | Zeng, A. | |
| dc.contributor.author | Jackson, M. K. | |
| dc.contributor.author | Van Hove, Marleen | |
| dc.contributor.author | De Raedt, Walter | |
| dc.contributor.imecauthor | De Raedt, Walter | |
| dc.date.accessioned | 2021-09-29T15:57:52Z | |
| dc.date.available | 2021-09-29T15:57:52Z | |
| dc.date.issued | 1996 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1682 | |
| dc.source.beginpage | 867 | |
| dc.source.endpage | 874 | |
| dc.source.journal | Optical and Quantum Electronics | |
| dc.source.volume | 28 | |
| dc.title | Electro-optical characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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