Publication:

Investigation of Microwave Loss Induced by Oxide Regrowth in High-Q Niobium Resonators

Date

2021
Journal article
https://doi.org/10.1103/PhysRevApplied.16.014018
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Author(s)

Verjauw, Jeroen  
;
Potocnik, Anton  
;
Mongillo, Massimo  
;
Acharya, Rohith  
;
Mohiyaddin, Fahd Ayyalil  
;
Simion, George  
;
Pacco, Antoine  
;
Ivanov, Tsvetan  
;
Wan, Danny  
;
Vanleenhove, Anja  
;
Souriau, Laurent  
;
Jussot, Julien  
;
Thiam, Arame  
;
Swerts, Johan  
;
Piao, Xiaoyu  
;
Couet, Sebastien  
;
Heyns, Marc  
;
Govoreanu, Bogdan  
;
Radu, Iuliana  

Journal

PHYSICAL REVIEW APPLIED

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1683 since deposited on 2021-11-02
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