Publication:

Investigation of Microwave Loss Induced by Oxide Regrowth in High-Q Niobium Resonators

Date

2021
Journal article
https://doi.org/10.1103/PhysRevApplied.16.014018
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dc.contributor.authorVerjauw, Jeroen
dc.contributor.authorPotocnik, Anton
dc.contributor.authorMongillo, Massimo
dc.contributor.authorAcharya, Rohith
dc.contributor.authorMohiyaddin, Fahd Ayyalil
dc.contributor.authorSimion, George
dc.contributor.authorPacco, Antoine
dc.contributor.authorIvanov, Tsvetan
dc.contributor.authorWan, Danny
dc.contributor.authorVanleenhove, Anja
dc.contributor.authorSouriau, Laurent
dc.contributor.authorJussot, Julien
dc.contributor.authorThiam, Arame
dc.contributor.authorSwerts, Johan
dc.contributor.authorPiao, Xiaoyu
dc.contributor.authorCouet, Sebastien
dc.contributor.authorHeyns, Marc
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorRadu, Iuliana
dc.contributor.imecauthorVerjauw, Jeroen
dc.contributor.imecauthorPotocnik, Anton
dc.contributor.imecauthorMongillo, Massimo
dc.contributor.imecauthorAcharya, Rohith
dc.contributor.imecauthorMohiyaddin, Fahd Ayyalil
dc.contributor.imecauthorSimion, George
dc.contributor.imecauthorPacco, Antoine
dc.contributor.imecauthorIvanov, Tsvetan
dc.contributor.imecauthorWan, Danny
dc.contributor.imecauthorVanleenhove, Anja
dc.contributor.imecauthorSouriau, Laurent
dc.contributor.imecauthorJussot, Julien
dc.contributor.imecauthorThiam, Arame
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorPiao, Xiaoyu
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.orcidimecPotocnik, A.::0000-0002-0352-6388
dc.contributor.orcidimecVerjauw, Jeroen::0000-0002-4215-8688
dc.contributor.orcidimecPotocnik, Anton::0000-0002-0352-6388
dc.contributor.orcidimecMongillo, Massimo::0000-0002-6475-6320
dc.contributor.orcidimecAcharya, Rohith::0000-0003-3958-6435
dc.contributor.orcidimecSimion, George::0000-0002-6880-6161
dc.contributor.orcidimecPacco, Antoine::0000-0001-6330-5053
dc.contributor.orcidimecIvanov, Tsvetan::0000-0003-3407-2742
dc.contributor.orcidimecWan, Danny::0000-0003-4847-3184
dc.contributor.orcidimecSouriau, Laurent::0000-0002-5138-5938
dc.contributor.orcidimecJussot, Julien::0000-0002-2484-3462
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.date.accessioned2022-06-09T07:35:06Z
dc.date.available2021-11-02T15:58:54Z
dc.date.available2022-05-19T07:41:09Z
dc.date.available2022-06-09T07:35:06Z
dc.date.embargo9999-12-31
dc.date.issued2021
dc.identifier.doi10.1103/PhysRevApplied.16.014018
dc.identifier.issn2331-7019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37727
dc.publisherAMER PHYSICAL SOC
dc.source.beginpage014018
dc.source.issue1
dc.source.journalPHYSICAL REVIEW APPLIED
dc.source.numberofpages14
dc.source.volume16
dc.subject.keywordsOXIDATION
dc.subject.keywordsGROWTH
dc.subject.keywordsSURFACES
dc.subject.keywordsSILICON
dc.subject.keywordsNB
dc.title

Investigation of Microwave Loss Induced by Oxide Regrowth in High-Q Niobium Resonators

dc.typeJournal article
dspace.entity.typePublication
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