Publication:
A low-voltage biasing scheme for aggressively scaled bulk FinFET 1T-DRAM featuring 10s retention at 85°C
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1961 since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1961 since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations