Publication:

A low-voltage biasing scheme for aggressively scaled bulk FinFET 1T-DRAM featuring 10s retention at 85°C

Date

2010

Proceedings Paper

Simple item page Full metadata Statistics

Files

20208.pdf 409.81 KB

Author(s)

Collaert, Nadine

;

Aoulaiche, Marc

;

De Wachter, Bart

;

Rakowski, Michal

;

Redolfi, Augusto

;

;

De Keersgieter, An

;

Horiguchi, Naoto

;

Altimime, Laith

;

Statistics

1967 since deposited on 2021-10-18

1last month

Acq. date: 2026-02-26