Publication:
Voltage ramp stress based lifetime-prediction model of advanced Al-doped HfO2 dielectric for 2.5D MIMCAPs
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681 since deposited on 2024-03-07
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Acq. date: 2026-01-09
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681 since deposited on 2024-03-07
2last month
1last week
Acq. date: 2026-01-09
Citations