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Light-induced capacitance alteration for non-destructive open failure localization in 3-D TSV structures
Publication:
Light-induced capacitance alteration for non-destructive open failure localization in 3-D TSV structures
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Date
2017
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jacobs, Kristof J.P.
;
Khaled, Ahmad
;
Stucchi, Michele
;
Wang, Teng
;
Gonzalez, Mario
;
Croes, Kristof
;
De Wolf, Ingrid
;
Beyne, Eric
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Views
1921
since deposited on 2021-10-24
2
last month
1
last week
Acq. date: 2026-02-25
Citations