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Design-for-Test for Intermittent Faults in STT-MRAMs
Publication:
Design-for-Test for Intermittent Faults in STT-MRAMs
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Date
2024
Proceedings Paper
https://doi.org/10.1109/ETS61313.2024.10567702
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yuan, Sicong
;
Yaldagard, Mohammad Amin
;
Xun, Hanzhi
;
Fieback, Moritz
;
Marinissen, Erik Jan
;
Kim, Woojin
;
Rao, Siddharth
;
Couet, Sebastien
;
Taouil, Mottaqiallah
;
Hamdioui, Said
Journal
N/A
Abstract
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237
since deposited on 2024-08-23
Acq. date: 2025-12-13
Citations
Metrics
Views
237
since deposited on 2024-08-23
Acq. date: 2025-12-13
Citations