Publication:

Design-for-Test for Intermittent Faults in STT-MRAMs

Date

2024
Proceedings Paper
https://doi.org/10.1109/ETS61313.2024.10567702
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dc.contributor.authorYuan, Sicong
dc.contributor.authorYaldagard, Mohammad Amin
dc.contributor.authorXun, Hanzhi
dc.contributor.authorFieback, Moritz
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorKim, Woojin
dc.contributor.authorRao, Siddharth
dc.contributor.authorCouet, Sebastien
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorHamdioui, Said
dc.contributor.imecauthorYuan, Sicong
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecKim, Woojin::0000-0002-2755-6661
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.date.accessioned2025-05-13T12:27:05Z
dc.date.available2024-08-23T17:30:06Z
dc.date.available2025-05-13T12:27:05Z
dc.date.issued2024
dc.description.wosFundingTextThis work is supported by IMEC's Industrial Affiliation Program on STT-MRAM devices.
dc.identifier.doi10.1109/ETS61313.2024.10567702
dc.identifier.eisbn979-8-3503-4932-0
dc.identifier.isbn979-8-3503-4933-7
dc.identifier.issn1530-1877
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44359
dc.publisherIEEE
dc.source.conferenceIEEE European Test Symposium (ETS)
dc.source.conferencedateMAY 20-24, 2024
dc.source.conferencelocationDen Haag
dc.source.journalN/A
dc.source.numberofpages6
dc.title

Design-for-Test for Intermittent Faults in STT-MRAMs

dc.typeProceedings paper
dspace.entity.typePublication
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