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Stress evolution during Ni-Si compound formation for fully silicided (FUSI) gates
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Stress evolution during Ni-Si compound formation for fully silicided (FUSI) gates
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Torregiani, Cristina
;
Van Bockstael, Charlotte
;
Detavernier, Christophe
;
Lavoie, Christian
;
Lauwers, Anne
;
Kittl, Jorge
Journal
Microelectronic Engineering
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1907
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-10
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Metrics
Views
1907
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-10
Citations