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Measurements of trace gaseous ambient impurities on an atmospheric pressure rapid thermal processor
Publication:
Measurements of trace gaseous ambient impurities on an atmospheric pressure rapid thermal processor
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Date
1999
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kondoh, Eiichi
;
Vereecke, Guy
;
Heyns, Marc
;
Maex, Karen
;
Gutt, T.
Journal
J. Vacuum Science and Technology A
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1947
since deposited on 2021-10-06
Acq. date: 2025-12-10
Citations
Metrics
Views
1947
since deposited on 2021-10-06
Acq. date: 2025-12-10
Citations