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Zero-energy SIMS: The role of surface roughness development with XeF2 based etching
Publication:
Zero-energy SIMS: The role of surface roughness development with XeF2 based etching
Date
2009
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanhove, Nico
;
Lievens, Peter
;
Vandervorst, Wilfried
Journal
Abstract
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1959
since deposited on 2021-10-18
422
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1959
since deposited on 2021-10-18
422
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations